The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 27, 1983
Filed:
Oct. 07, 1981
Werner Schmidt, Aalen, DE;
Gerhard Mueller, Aalen, DE;
Klaus Weber, Konigsbronn, DE;
Volker Wilke, Aalen, DE;
Carl Zeiss-Stiftung, Oberkochen, DE;
Abstract
The invention contemplates scanning-microscope display of plural observed parameters of an examined specimen, where the parameters derive from flying-spot light-exposure of the specimen, and where at least one of the observed parameters is outside the wavelength range of the flying-spot. In some illustrative embodiments, at least one of the observed parameters is sensed by a detector which uses the same scanning optics as the flying-spot, and in other embodiments other techniques of synchronization are involved. The disclosed embodiments also provide for selective arrest of scanning to enable such factors as fading fluorescence and spectrum analysis to be ascertained strictly for a surface occlusion, impurity or other anomaly of interest.