The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 1983
Filed:
Apr. 28, 1981
Applicant:
Inventor:
Toshiyuki Koga, Tokyo, JP;
Assignee:
Kabushiki Kaisha Daini Seikosha, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G21K / ;
U.S. Cl.
CPC ...
378050 ; 378 89 ; 378206 ;
Abstract
A thickness measuring apparatus in which a shutter is horizontally interposed between an X-ray tube and the collimator defining the irradiated area of the test piece. While the X-ray beam is thus blocked, the area of the test piece which will be irradiated is viewable, via a mirror, thru a microscope. Typically, the device is used for measuring nickel plating on a copper base for which use it is equipped with a cobalt filter.