The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 20, 1983
Filed:
Dec. 21, 1981
Applicant:
Inventors:
Yasuo Kuraoka, Sapporo, JP;
Norihide Hosoda, Sapporo, JP;
Assignee:
Hoxan Corporation, Sapporo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
374 46 ; 73844 ; 73 12 ;
Abstract
A cryogenic impact testing method of Charpy's and falling weight types which can test a test piece without substantially exposing the test piece with the atmospheric air under the same test piece cooling space, temperature controlling space and impact testing space, and a cryogenic impact testing machine of Charpy's and falling weight types which can execute suitably the above method. Thus, the stable temperature of the test piece can be obtained at the time of testing with highly reliable measured result.