The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 1983

Filed:

Nov. 04, 1981
Applicant:
Inventors:

Eiichi Sano, Tokyo, JP;

Kazuo Nunokawa, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ; A61B / ;
U.S. Cl.
CPC ...
351208 ; 354 62 ;
Abstract

A working position locating device for an ophthalmologic apparatus in which the projected image of a ring slit aperture is offset from the projecting optical axis when the position of the apparatus is being changed so that the ring slit image be seen on the focal plane of the observation optical system, whereby the proper working position of the objective lens relative to the eye can be grasped from the position of the ring slit image.


Find Patent Forward Citations

Sano, Eiichi. (1983). Working position locating means for ophthalmologic apparatus (U.S. Patent No. 4405215). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4405215

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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