The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 1983
Filed:
Dec. 16, 1980
Makoto Hayashi, Hitachi, JP;
Tasuku Shimizu, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided is a method for foreseeing the residual life of a structural member, making use of an X-ray, comprising: preparing a plurality of test pieces made of the same material and subjected to the same working and heat-treating conditions as the structural member to be examined of which the fatigue strength is in question; executing fatigue tests with said test pieces till failure under a plurality of different stress conditions; obtaining for each stress the relationship between the residual life of said test piece and the halfvalue width ratio of X-ray diffraction profile; determining, from the above-mentioned relationships, a first relationship region between the halfvalue width ratio and the residual life that is independent of the level of the stress; measuring the halfvalue width ratio of said structural member; and determining the residual life of said structural member from the measured halfvalue width ratio in accordance with said first relationship region.