The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 1983
Filed:
Dec. 02, 1981
Heinrich Juergensen, Raisdorf, DE;
Thomas Zelenka, Kiel, DE;
Dr. Ing. Rudolf Hell GmbH, , DE;
Abstract
Positional errors are corrected for a light beam which is deflected point and line-wise across a scanning surface by a polyhedral rotating mirror. For each mirror surface, the positional errors are measured in the line direction and perpendicular thereto at a plurality of measuring points oriented in the line direction in the area of the scanning surface. Correction values are generated which, during simultaneous error measurement, are changed until the positional errors are compensated by means of correction elements. The determined correction values are stored and are read out for continuous correction during the actual operation synchronously with the mirror surfaces simultaneously located in the beam path. Light deflectors are employed as correction elements. Employing the rotating mirror in a recording arrangement, transit time elements controlled by the correction values are disposed as correction elements in the signal path of the image signal for the correction of the positional errors in the line direction. If the image signal is stored, the frequency of the read clock can alternately be changed as a function of the correction values. The method is very accurate so that, in particular, errors caused by uneven mirror surfaces are corrected.