The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 13, 1983
Filed:
Nov. 12, 1980
Walter H Lang, Konigsbronn, DE;
Franz Muchel, Konigsbronn, DE;
Carl Zeiss-Stiftung, Oberkochen, DE;
Abstract
The invention provides an ophthalmological technique and instrumentation for making better and more facile examinations of the anterior portion of an eye, by employing a known interference-contrast technique in on-axis combination with an illumination-source, and having the feature of binocular-microscope viewing. In the form described, polarized light from the source is introduced to the microscope-objective axis at a location between a Nomarski prism and the associated analyzer of the interference-contrast system. This polarized light passes through the Nomarski prism and the microscope objective enroute to the eye being examined; from the eye, it is reflected back through said objective and prism to the analyzer, where a beam-splitting prism serves the respective ray paths of a binocular-microscope viewing system.