The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 1983
Filed:
Aug. 18, 1981
Applicant:
Inventors:
Daizo Tokinage, Hachioji, JP;
Teruaki Kobayashi, Hachioji, JP;
Mitsuyoshi Yuasa, Hachioji, JP;
Michio Itoh, Tokorozawa, JP;
Kazuo Yasuda, Katsuta, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
356341 ; 356343 ; 356442 ; 436805 ;
Abstract
A nephelometric immunoassay and a nephelometer therefore, characterized in that light is projected on a sample to-be-measured containing an antigen-antibody complex, that at least two light scattering intensities at different angles with respect to the incident light are measured, and that a true antigen concentration is discriminated by comparing the light scattering intensities.