The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 1983
Filed:
Sep. 25, 1981
Michael R Daniel, Monroeville, PA (US);
John D Adam, Murrysville, PA (US);
Robert A Moore, Arnold, MD (US);
Abstract
The linearity of group delay versus frequency in magnetostatic wave delay lines is improved by a linear variation of one of three discrete parameters in the region between the two delay line transducers. The parameter variation is applied to magnetostatic wave delay lines that have a ground plane, a magnetic garnet crystal film substrate that is spaced from the ground plane and has transmitting and receiving transducers engaged to it, and a magnetic bias field. The discrete parameters varied are the magnetic bias field; the distance of the substrate from the ground plane; and the thickness of the substrate. Appropriate linear variations of any one of the these parameters provides improved linearity of group delay versus frequency.