The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 1983

Filed:

Jan. 28, 1982
Applicant:
Inventors:

Masaru Isono, Tokyo, JP;

Kazuo Nunokawa, Tokyo, JP;

Masayuki Kondo, Tokyo, JP;

Shinzo Takada, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ; A61B / ; H04N / ;
U.S. Cl.
CPC ...
354 25 ; 354 62 ; 351208 ; 351211 ; 358227 ;
Abstract

A focus detecting device for an eye fundus camera including a target having a target pattern comprised of a first slit and a second and third slits disposed in parallel with and at the opposite sides of the first slit. The second and third slits are symmetrical to each other with respect to the first slit. Deflecting prisms are provided to deflect the luminous flux through the first slit in one direction perpendicular to the longitudinal axis of the first slit and the luminous fluxes through the second and third slits in the opposite direction. The slit pattern is convenient for automatic focus adjustment.


Find Patent Forward Citations

Isono, Masaru. (1983). Focus detecting device for opthalmologic instruments (U.S. Patent No. 4400070). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4400070

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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