The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1983
Filed:
Dec. 17, 1980
Masafumi Soma, Fussa, JP;
Yoshihiko Kohno, Kokubunji, JP;
Iwasaki Tsushinki Kabushiki Kaisha, Tokyo, JP;
Abstract
A waveform searching system for a sampling oscilloscope, in which the instantaneous level of a high-speed sawtooth signal generated by a trigger signal synchronized with an input analog signal and the instantaneous level of a properly attenuated or amplified X-axis sweep wave are compared with each other to generate a pulse in a case of coincidence therebetween, thereby to generate sampling pulses sequentially delayed after the trigger signal by a constant time; the input analog signal is sampled by the sampling pulses to produce sampled pulses; and the sampled pulses are displayed by the X-axis sweep signal on a CRT. In accordance with the present invention, there are provided detecting means for detecting a predetermined condition where a waveform formed by respective peak values of the sampled pulses cross in a predetermined direction at a predetermined search level by a predetermined number; and control means for sequentially changing a time base range until the detecting means detects the predetermined condition, whereby the sampled pulses having the predetermined condition are automatically displayed on the CRT.