The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 1983
Filed:
Nov. 13, 1979
Applicant:
Inventor:
Godfrey N Hounsfield, Newark, GB;
Assignee:
EMI Limited, Hayes, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364414 ; 378-4 ; 378 21 ; 378901 ;
Abstract
A method of examining a patient with x-rays is described in which x-ray measurements are taken of the attenuation suffered by x-radiation when projected across a cross-sectional slice of a patient's body along each of many substantially linear beam paths and are subjected to compensated back-projective processing to produce an x-ray picture representing the variation of attenuation of the radiation with position over the slice. Beam paths which are next to each other in space are arranged to overlap each other.
Hounsfield, Godfrey. (1983). Apparatus for examining a body by radiation such as x or gamma radiation (U.S. Patent No. 4399509). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4399509
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile