The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 1983

Filed:

Oct. 14, 1980
Applicant:
Inventors:

Peter Draheim, Hamburg, DE;

Friedrich Hapke, Hamburg, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ; 324 / ;
Abstract

A test circuit for use in an MOS device includes two inputs, a first input which is responsive to a test signal of opposite polarity to that of the supply voltage, and a second input which is responsive to a test signal of the same polarity as that of the supply voltage but of a substantially higher magnitude than that of the supply voltage. The test circuit is enabled only when both the opposite polarity signal on the first input and the higher magnitude signal on the second input occur. In this manner a substantial immunity to spurious voltage transients of either polarity is obtained while permitting the test circuit and the circuits on the same MOS device being tested to share common terminals.


Find Patent Forward Citations

Draheim, Peter. (1983). Test circuit for mos devices (U.S. Patent No. 4398146). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4398146

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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