The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 1983

Filed:

Apr. 06, 1981
Applicant:
Inventor:

Akio Taira, Hachiouji, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350526 ; 350572 ;
Abstract

An illumination system for microscopes which composes an illumination system for microscopy at high magnification level of a light source, a collector lens, a field stop, an aperture stop, a relay lens system for high magnification level and a condenser lens, and composes an illumination system for microscopy at low magnification level by using a relay lens system for low magnification level in place of said relay lens system for high magnification level and said condenser lens employed for composing the illumination system for microscopy at the high magnification level. Said illumination system is so adapted as to provide favorable illumination within a wide magnification range from 1.times. to 100.times..


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