The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 1983
Filed:
Jan. 07, 1981
Charles W Brouwer, East Greenwich, RI (US);
Leesona Corporation, Warwick, RI (US);
Abstract
A quality monitoring system for looms is disclosed. The system includes a plurality of signal producing units disposed at various loci on the loom. These units operate to detect faults in the warp or filling yarns being woven into the fabric. Detection of such faults produce signals which are registered and accumulated in a counter. Signals provided from different sources can be weighted at different values so that a fault from one source can excite the counter to a different level than a fault from another source The accumulation of these values thus provides a quality point index indicative of the probable quality of the fabric being woven. Since a useful application of the quality point index is to assess this index or value in terms of faults in the woven fabric per unit length of loom operating time, or unit length of fabric woven, a divider circuit is provided to divide either of the aforementioned units by faults detected. A display is provided as a visual readout for the quality point index per unit length after this division step is completed.