The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 1983

Filed:

Oct. 16, 1981
Applicant:
Inventors:

Kyoichi Fujimori, Higashimatsuyama, JP;

Hidekazu Oshizawa, Kumagaya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
7311 / ; 123479 ;
Abstract

In a method for detecting the occurrence of a fault in a first sensor for producing first pulses of a repetitive time period related to a first condition to be detected or the occurrence of fault in a second sensor for producing second pulses indicative of a second condition to be detected at a ratio of one pulse to the production of N first pulses, the first pulses and the second pulses are used for monitoring each other and the detection of the occurrence of trouble in these sensors can be carried out with high reliability.


Find Patent Forward Citations

Fujimori, Kyoichi. (1983). Sensor trouble detecting method and apparatus (U.S. Patent No. 4395905). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4395905

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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