The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1983

Filed:

Aug. 15, 1980
Applicant:
Inventors:

Stanley R Sternberg, Ann Arbor, MI (US);

William O Dargel, Ann Arbor, MI (US);

Robert M Lougheed, Ann Arbor, MI (US);

David L McCubbrey, Ann Arbor, MI (US);

Ralph E Richardson, Eatontown, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; G06F / ;
U.S. Cl.
CPC ...
382 27 ; 364768 ; 364900 ; 377 70 ; 382 41 ; 382 49 ;
Abstract

An image analyzer system employs one or more neighborhood transformation stages. The stage operates to access groups of neighboring pixels in an image matrix, analyzes them and generates a transformation output as a result of the analysis. The stage includes a logic circuit which is programmable from a central controller. In the preferred embodiment, each pixel in the neighborhood is analyzed by the logic circuit and temporarily stored until other pixels in the group have been analyzed. The combination of analyzed pixel values form the basis for generating the transformation output for the stage. Preferably, the logic circuit is designed to perform both two dimensional and three dimensional image analyses.


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