The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1983

Filed:

Aug. 15, 1980
Applicant:
Inventors:

William O Dargel, Ann Arbor, MI (US);

Robert M Lougheed, Ann Arbor, MI (US);

David L McCubbrey, Ann Arbor, MI (US);

Ralph E Richardson, Eatontown, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 41 ; 382 49 ;
Abstract

An image analyzer system and a method of analyzing image information contained in serial scan lines of pixels in which some of the pixels have valid data values representing image information while other pixels have invalid data values not representing characteristics of the image to be analyzed. Off image detector circuitry is utilized to generate output signals to neighborhood transformation logic when one or more pixels in a neighborhood contain invalid values. Preferably, the off image detector means monitors the status of a control line which indicates whether valid or invalid pixels are being transferred over a bus to a stage of the image analyzer system. The detector circuitry operates to store the number of valid pixels in subsequent scan lines presented to the stage. This comparison is utilized to detect invalid pixel values which may be contained in each neighborhood.


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