The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 1983
Filed:
Aug. 05, 1980
Nobutaka Kaneko, Hachiouji, JP;
Toshihide Fujiwara, Fuchu, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A sample centering system comprising a photometric system for colorimetrically measuring samples applied onto a carrier shifted in a definite direction, a detection system arranged at a definite interval apart from said photometric system, a sample detection signal generating means for generating a signal on the basis of the output from said detection system, and a shifting timer which is operated on the basis of said sample detection signal or at a definite time after shifting of said carrier is started, said sample centering system being so adapted as to stop said carrier when said shifting timer is turned off after a definite time, thereby making it possible to stop said carrier always at a time when a sample is located on the optical axis of said photometric system regardless of sample conditions.