The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 1983

Filed:

Oct. 30, 1980
Applicant:
Inventors:

Kazuo Nakata, Fujisawa, JP;

Akihiko Iochi, Odawara, JP;

Isamu Kaise, Fujisawa, JP;

Kazuo Takeuchi, Kamakura, JP;

Katsuhiko Nomura, Kamakura, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ;
U.S. Cl.
CPC ...
356 73 ; 250560 ; 356237 ; 356385 ;
Abstract

Disclosed is a method for the automatic, nondestructive, measurement of the eccentricity of a core wire in a coating composition coated upon an electrode, the measurement being formed by at least two sets of optical means, each including a light source and a line sensor. One of the optical sensors is positioned to measure the diameter of a coated portion of the core wire while at least one of the remaining sensors is positioned to measure the diameter of an uncoated portion. The positions and diameters of both portions are compared to find the eccentricity of the core wire. Where three sensors are used to measure the position and thickness of the exposed wire portion, the eccentricity of a misaligned or bent rod can be determined.


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