The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 1983

Filed:

Jun. 26, 1980
Applicant:
Inventors:

Nicholas Liptay-Wagner, Windsor, CA;

Roland Renaud, Windsor, CA;

Timothy R Pryor, Tecumseh, CA;

Donald A Clarke, Windsor, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358107 ; 358106 ; 358166 ; 382 65 ;
Abstract

A method and apparatus are provided for analyzing the light pattern produced on a photodetector array. The signal produced by the array is filtered with a low pass filter and the output of the filter is differentiated to obtain either the first or second derivative of the filtered signal for one or more points in the pattern. The zero crossing of the differentiated signal is detected and the zero crossing point is timed relative to a further point, e.g., the start of the scan of the array, so as to obtain an output related to the position of the corresponding point or points in the pattern.


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