The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1983
Filed:
Sep. 29, 1980
Eiichi Tanaka, Mitaka, JP;
Norimasa Nohara, Chiba, JP;
Hideo Murayama, Chiba, JP;
Kenji Ishimatsu, Abiko, JP;
Akira Ogushi, Mito, JP;
Katsumi Takami, Tokyo, JP;
National Institute of Radiological Sciences, Chiba, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An apparatus for a detecting the location of incident radiation comprises at least one pair of assembly comprised of a scintillation crystal consisting of a plurality of crystal segments, a pair of photo-multiplier tubes optically coupled to the scintillation crystal so as to be able to detect a scintillation produced in any one of these crystal segments. These plural crystal segments are coupled to each other in such manner that any scintillation produced in any single crystal segment will cause the photo-multiplier tubes to deliver substantially a same output irrespective of the illuminating position within this crystal segment, and also that scintillations produced in the respective crystal segments will cause the photo-multiplier tubes to deliver outputs which are different in level for the respective crystal segments.