The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 1983

Filed:

Nov. 13, 1981
Applicant:
Inventors:

Yasushi Kamezaki, Sakai, JP;

Eiichi Inoue, Tokyo, JP;

Hitoshi Nishihama, Hirakata, JP;

Akira Fushida, Suita, JP;

Joji Matsumoto, Neyagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G / ; G03G / ;
U.S. Cl.
CPC ...
430126 ; 430 31 ; 430 89 ; 430 91 ; 430902 ; 101D / ;
Abstract

In an electrostatic photographic process comprising subjecting an electrostatic photographic photosensitive plate to the combination of negative charging, positive charging and imagewise exposure to form an electrostatic latent image of a positive polarity, said electrostatic photographic photosensitive plate having such charging characteristics that a photosensitive layer can be positively charged by sequential negative corona charging and positive corona charging and positive charging is rendered substantially impossible by irradiation with light, and then subjecting the so treated photosensitive plate to positive charging a predetermined number of times, whereby an electrostatic latent image is formed the predetermined number of times by imagewise exposure conducted once, if a zinc oxide-resin dispersion is used for the photosensitive layer of the photosensitive plate and predetermined amounts of a triphenylmethane basic dye and a silicone oil are incorporated in the photosensitive layer, the time required for negative charging can be shortened, and the charge potential at the time of positive charging can be increased and accumulation of the residual potential after irradiation with light can be reduced.


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