The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1983

Filed:

Jan. 10, 1980
Applicant:
Inventors:

Fritz Berthold, 754 Neuenburg, DE;

Seppo Kolehmainen, Zolder, BE;

Veikko Tarkkanen, Wijlre, NL;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; C12Q / ;
U.S. Cl.
CPC ...
356 36 ; 435-8 ; 356436 ;
Abstract

A method for photometrically measuring a reaction process at a darkened measuring station which contains a sample having an unknown quantity of a substance which acts as a reaction partner with a reagent. The sample is provided with a first reagent which acts as a reaction partner with a reaction partner present in the sample. A first photometric measurement of the sample is taken at the darkened measuring station to measure the reaction process between the first reagent and the reaction partner in the sample, and this first measurement is used for computation. At least one additional reagent which differs from the first reagent and which constitutes a further reaction partner is added to the sample at the darkened measuring station after the first photometric measurement. A photometric measurement of the sample is conducted after the addition of each additional reagent and during the course of a reaction between reaction partners then present. The unknown quantity of the substance in the sample is determined from all the measured values. The first reagent can be added to the sample prior to transferring the sample to the darkened measuring station or can be added to the sample at the darkened measuring station.


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