The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 1983
Filed:
Jun. 01, 1981
Applicant:
Inventors:
Jonathan Ophir, Houston, TX (US);
Nabil F Maklad, Houston, TX (US);
Assignee:
North American Philips Corporation, Tarrytown, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73599 ; 73600 ; 128660 ;
Abstract
Method and apparatus for measuring an attenuation characteristic in a region of interest using ultrasound wherein two statistically independent set of values are accumulated as a difference between logarithms of pairs of each signal set, and the attenuation characteristic calculated as a central tendency parameter of each set of values.