The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 1983

Filed:

Dec. 02, 1980
Applicant:
Inventors:

Hideo Sakata, Kawasaki, JP;

Seigo Takahashi, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3314 / ; 3314 / ; 3314 / ;
Abstract

Herein disclosed is a measuring device such as a micrometer, slide calipers, a depth gauge or a height gauge, in which a slider is so provided that it can move back and forth in the same direction of such a relatively movable portion as can move relative to a frame and that it can be fixed on said frame at any position in the forward and backward moving directions thereof, and in which there is interposed between said slider and said relatively movable portion such spring bias means as can apply its spring force to said relatively movable portion in the forward and backward moving directions of the same, whereby the measuring pressure to be applied to a test piece by said relatively movable portion can be automatically predetermined at a substantially constant level independently of the position of said relatively movable portion relative to said frame.


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