The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 1983
Filed:
Dec. 22, 1980
Dennis E O'Brien, Arlington Heights, IL (US);
UOP Inc., Des Plaines, IL (US);
Abstract
The invention provides a method and apparatus for determining the approximate temperature profile of a large curved surface such as the outer surface of a chemical or hydrocarbon conversion reactor. At least two arrays of wire having a temperature dependent electrical resistance are placed over the surface to be monitored, with the arrays being aligned in different directions to cover the surface with a grid of overlapping wires. By measuring the resistance of each wire and comparing this resistance to predetermine reference values, wires which pass through regions of elevated temperature compared to the remainder of the surface may be located. By attributing the elevated temperatures to the area covered by the intersecting wires which show an increased resistance the areas of high temperature on the surface may be located. The system requires fewer connections and is simpler than a temperature monitoring system which requires a thermocouple or other temperature measuring means to be located at each corresponding intersecting grid point.