The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 1983

Filed:

Sep. 05, 1980
Applicant:
Inventors:

Hirotsugu Fujimoto, Hitachi, JP;

Tsutomu Hayashi, Hitachi, JP;

Tatsukuma Hosono, Hitachi, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73637 ;
Abstract

A semi-automatic scanner for ultrasonic flaw detection comprises a carriage travelling on a guide rail, a guide arm extending in a direction transverse to the travel direction of the carriage and supported by the carriage so as to pivot in a plane transverse to the travel direction of the carriage, a probe holder slidably supported by the arm, and a probe mounted on said probe holder so as to pivot about two axes transverse to each other. One of the axes is generally in parallel to the travel direction of the carriage. The carriage is driven by a motor, and the probe is moved by manual or motor-driving operation in a direction transverse to the travel direction of the carriage while pressing the probe on a surface to be inspected, whereby the probe accurately follows the surface even if the surface is curved.


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