The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 1983

Filed:

May. 14, 1979
Applicant:
Inventors:

Edward L Glaser, Santa Monica, CA (US);

Louis M Galie, Culver City, CA (US);

Assignee:

System Development Corp., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364200 ; 3401462 ; 364728 ;
Abstract

Method and apparatus are disclosed for determining a particular criterion value and an associated positional value for the degree of match between the juxtaposition of a plurality of events of a query and a plurality of corresponding events of a stored data base entry. Plural processors are utilized. Each processor includes a plurality of data stores and a temporary store for each data store. Each data store stores a group of data values. The data values are priorly formed and represent the number of event positions between the occurrence of events in the query and the occurrence of the corresponding events in the stored data base. The plural processors, working together using the plural data stores and the temporary stores, form determined data values and sum-of-distance values which are then used for deriving a criterion value and a positional value corresponding to the degree of match between the query and the data base.


Find Patent Forward Citations

Loading…