The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 1983
Filed:
Apr. 27, 1981
Applicant:
Inventors:
Frederick J Feiertag, Seattle, WA (US);
Dale L McLellan, Bellevue, WA (US);
Assignee:
The Boeing Company, Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73 87 ;
Abstract
Method of nondestructively measuring percent elongation or ductility of a cellular metallic. After surface preparation, the number of metal cells per unit area are counted, either manually or using an automated technique. The cell count is utilized in a relationship unique to the cellular metallic which correlates cell count to ductility in terms of percent elongation. The effects of the structural configuration of the cellular metallic, porosity and eutectic morphology are also discussed.