The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 1983

Filed:

Sep. 10, 1980
Applicant:
Inventors:

Geoffrey Harding, Rellingen, DE;

Wolfgang Wagner, Hamburg, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 87 ; 378-6 ;
Abstract

Devices that measure the electron density in a body by means of radiation scattered from a narrow pencil beam of penetrating radiation directed through the body, produce defective images on reconstruction of the density distribution because of multiple scattering of radiation. This can of course be reduced by scattered ray diaphragms, but cannot be eliminated entirely. The invention therefore provides a means for detecting the size of the multiple scattered radiation component be measurement. For this purpose, the detector array which measures radiation including the single scattered radiation, is screened, at least osscasionally, from the single scattered radiation and the detected intensity values measured by the detector elements when so screened, are used to correct the values generated by measuring the detected radiation including the single scattered radiation.


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