The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1983
Filed:
Apr. 14, 1981
Volkmar Gotze, Grafenau, DE;
Dieter Schutt, Munich, DE;
International Business Machines Corp., Armonk, NY (US);
Abstract
An apparatus and a method to automatically locate defects and to automatically insert and personalize dummy lines in a PLA having latches controlling the cross points of the AND and OR array. Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the PLA and which initiates a test procedure. The cross point latches are automatically loaded with test patterns and the output of the PLA is analyzed to locate the defective part, for example, a damaged cross point transistor, short circuited or open line. The dummy lines are repersonalized automatically to replace lines which are defective themselves or which are connected to defective crosspoints.