The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 1983
Filed:
Apr. 07, 1981
James R McColl, Concord, MA (US);
GTE Laboratories Incorporated, Waltham, MA (US);
Abstract
Apparatus for automatically measuring aperture size of a slotted apertured material includes a means for supporting and transporting a slotted apertured material having a plurality of slots with each having a longitudinal axis and a comparator mask overlaying the apertured material and having alternate light transparent and opaque sectors, a light source and a light detector disposed on opposite sides of the slotted apertured material and having a light beam directed therethrough wherein a rhombic-shaped aperture controls the size and shape of the light beam impinging the detector whereby advancement of the rhombic-shaped aperture along a diagonal axis provides a reduced rate of change in light transmitted by the slots and received by the light detector whereby fluctuations in light transmission are reduced for random variations in mask placement.