The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 1983
Filed:
Nov. 06, 1980
John W Miller, Toledo, OH (US);
Owens-Illinois, Inc., Toledo, OH (US);
Abstract
An apparatus for displaying an output of an inspection device for objects such as glass bottles and the like is connected to a source of data signals each proportional in magnitude to the amount of light received from an associated point on the object being inspected. The data signals are inputs to a storage means and an adder for generating a signal representing the difference between each one of the data points and an adjacent one of the data points stored in the storage means. Each difference signal is compared with a threshold signal to generate an event signal when the magnitudes differ. The event signals are displayed as a two-dimensional representation of the surface of the object as if it had been cut and unwrapped. The operator can repeat the inspection utilizing different threshold values to optimize the defect detection performance of the inspection device. If the storage means is disabled and the threshold signals magnitudes are set to zero, the data signals will pass through to be displayed as the data signal magnitudes on one orthogonal axis and the location of the associated points on the other axis.