The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 1983
Filed:
Nov. 07, 1980
John W Miller, Toledo, OH (US);
Owens-Illinois, Inc., Toledo, OH (US);
Abstract
An apparatus and a method for identifying defects in objects, such as glass bottles, utilizing data signals generated from a photodiode camera and light source. Event signals are generated when the magnitudes of adjacent data signals differ by an amount which exceeds a threshold level. Signals are also generated to identify the location of each event signal with respect to a corresponding photodiode and to identify during which vertical sweep of the object the event signal was generated to associate the event signal with a point on the object. The event signals are processed to identify defects. Events in proximity in the same sweep are identified as a string. Event magnitudes and totals in a string are compared with predetermined values to identify defects. Strings in proximity are identified as a blob. Event magnitudes and totals and blob width are compared with predetermined values to identify defects.