The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1983
Filed:
Oct. 03, 1980
Applicant:
Inventor:
Hiroshi Takekawa, Kunitachi, JP;
Assignee:
Olympus Optical Company Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436539 ; 356246 ; 422 72 ; 422 73 ; 422102 ;
Abstract
Method for measuring agglutinating reaction by checking an agglutinates pattern caused by immunological agglutinating reaction while using a reaction vessel having at least one smooth recess formed on an inner sidewall surface thereof. After reaction liquid is placed therein, the reaction vessel is rotated about an axis thereof, so as to accelerate the agglutinating reaction by collecting corpuscles of the liquid in the recess. If the agglutinating reaction occurs, agglutinates released from the recess quickly sediment on the bottom of the reaction vessel to form an agglutinates pattern to be detected.