The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 1983
Filed:
Jan. 07, 1981
Applicant:
Inventors:
Taylor A Reid, Newport Beach, CA (US);
James A Miller, Fullerton, CA (US);
Duane G Barber, Yorba Linda, CA (US);
Assignee:
Beckman Instruments, Inc., Fullerton, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356326 ;
Abstract
A single beam spectrophotometer is conditioned to automatically scan a sample across a wavelength scan range and to measure the sample at selected wavelengths within the range. Methods of setting output signal gain, adjusting signal gain for a selected wavelength range, and automatically scanning and measuring the sample are disclosed.