The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 1983

Filed:

Feb. 25, 1981
Applicant:
Inventor:

John M Dugan, Garland, TX (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03L / ;
U.S. Cl.
CPC ...
375120 ; 307516 ; 328155 ; 329 50 ; 360 51 ;
Abstract

A digital sampling phase detector is provided for NRZ data phase detection and is particularly suited for applications with long sequences of no data activity. In a phase locked loop application, phase error circuitry detects the phase difference between data transitions and clock transitions of the recovered clock, and outputs phase error signals corresponding to various durations between designated transitions. Sampling switching circuitry responds to a data transition to initiate a measuring interval by forcing the output of the phase error circuitry to a low impedance follower mode to permit sampling, and responds to a designated clock transition to terminate the measuring interval by forcing the output to a high impedance state. The sampling switching circuitry prevents the sampled signal level from drifting during a non-measuring interval, and the reduction of drift significantly reduces jitter in the recovered clock. The sampling function is provided in combination in a high speed ECL phase detector.


Find Patent Forward Citations

Loading…