The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 1983
Filed:
Mar. 21, 1980
Applicant:
Inventors:
Kiichi Kamiyama, Tokyo, JP;
Yoshinori Oana, Tokyo, JP;
Assignee:
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351245 ; 351205 ;
Abstract
An actuating means for an ophthalmoscopic instrument wherein the adjustment knobs and handle are relatively located such that the knobs can be conveniently actuated by fingers of a hand gripping the handle.
Kamiyama, Kiichi. (1983). Apparatus for measuring curvatures of a spherical surface (U.S. Patent No. 4371237). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4371237
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile