The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 1983
Filed:
Aug. 15, 1979
Applicant:
Inventors:
Sherwood Kantor, Longmont, CO (US);
Randall A Maddox, Lexington, KY (US);
Paul S Yosim, Lafeyette, CO (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
3401 / ; 250208 ; 250578 ; 3401 / ; 358212 ;
Abstract
Dimensional variations, such as skew, alignment and abutment, in an array scanner are corrected by scanning and storing into a storage means an uncorrected electronic image generated from a test pattern. Correctional factors are generated from the stored electronic image. The correctional factors are used to correct the dimensional variations in the electronic image of the test pattern and/or dimensional variations in subsequent electronic image outputted from the scanner.