The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 1983
Filed:
Dec. 22, 1980
Applicant:
Inventor:
Reimar Spohr, Darmstadt, DE;
Assignee:
Gesellschaft fur Schwerionenforschung mbH Darmstadt, Darmstadt, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
378160 ; 328233 ;
Abstract
Method for producing nuclear traces, or microholes originating from nuclear traces, from a single ion or a countable number of ions in a solid body by means of an accelerator, e.g. heavy ions in a heavy ion accelerator. A widened or attenuated beam or ions is directed onto the surface of a solid body via a preliminary aperture to cut out any non-required particles. The impinging of an individual particle, after or before passage through the solid body, is determined directly and depending of this determination, other particles which might possibly pass through the aperture are prevented from doing so.