The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 1983
Filed:
Nov. 13, 1980
Applicant:
Inventor:
Harold E Bennett, Ridgecrest, CA (US);
Assignee:
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356445 ;
Abstract
An apparatus and method to measure the absolute reflectivity of a sample is made by use of a multiple pass reflectometer. A given light beam permits measurement of the absolute reflectivity by comparing a portion of the light beam in a reference White cell to the change in light of another portion of the beam which undergoes equivalent reflections except for the addition of the sample in one configuration as compared to the other.