The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 1982

Filed:

Mar. 03, 1980
Applicant:
Inventor:

Masao Nohda, Yokohama, JP;

Assignee:

Nippon Kogaku K.K., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351208 ; 351214 ;
Abstract

A position adjusting device attached to an ophthalmologic measuring instrument to accurately position an eye to be examined with respect to the ophthalmologic measuring instrument comprises projection means for projecting a predetermined projection pattern upon the eye to be examined, an objective lens group for observing therethrough the reflected image of the projection pattern by the cornea of said eye, a field stop provided at the image forming position of the objective lens group, a light-intercepting member provided near the objective lens group and having two openings outside of the optic axis of the objective lens group, a reflecting member obliquely disposed on the optic axis of the objective lens group rearwardly of and near the light-intercepting member, a position adjusting standard chart, and a projection lens for projecting the image of the standard chart onto the position of the field stop through the reflecting member.


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