The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 1982
Filed:
May. 12, 1980
Applicant:
Inventors:
Walter H Lang, Konigsbronn, DE;
Franz Muchel, Konigsbronn, DE;
Assignee:
Carl Zeiss-Stiftung, Oberkochen, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350516 ; 350520 ; 350573 ;
Abstract
The invention contemplates a modular system of interchangeable and multiply-combinable objective-lens components for selective use with an operation microscope to enable improved viewing of small operational areas, particularly in areas which are in deep channels or recesses. The construction permits optional use of the instrument in the context of stereoscopic or split-beam binocular viewing, or as an endoscope. Viewing is enhanced by efficient light transmission of both (a) the light used for object illumination and (b) the optical transmission of the image to be viewed.