The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1982
Filed:
Jan. 07, 1981
Michael O'Brien, Davis, CA (US);
Nelson E Smith, Jr, Davis, CA (US);
Stanley E Prussia, Griffin, GA (US);
The Regents of The University of California, Berkeley, CA (US);
Abstract
Method and apparatus for grading large batches of fruit by sampling technique. A sample, drawn from a batch, is divided into two approximately equal portions, one portion being inspected without being weighed. The other portion is weighed and then inspected. Grade-defect material is placed into separately classified buckets and weighed one by one. Grade-defect percentages are then determined and acceptance and grading thereby determined. A weigh hopper is suspended from a load cell by a pair of wires, one at each side of the weigh hopper. A turnbuckle on each wire enables adjustment, and excessive motion of the weigh hopper is dampened. The load cell is suspended from a shock transmission member which rests on a shock-absorbing spring that is compressed when shock loads are exerted. A cable attached to the center of the upper edge on one end of the weigh hopper passes around the bottom of the weigh hopper and to a cam device, to provide smooth inversion of the weigh hopper and a dwell period at full inversion.