The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1982
Filed:
Dec. 09, 1980
Applicant:
Inventors:
David S Kupperman, Oak Park, IL (US);
Karl J Reimann, Lisle, IL (US);
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73623 ; 73642 ; 73 / ;
Abstract
The invention is an ultrasonic testing device for rapid and complete examination of the test specimen, and is particularly well suited for evaluation of tubular test geometries. A variety of defect categories may be detected and analyzed at one time and their positions accurately located in a single pass down the test specimen.
Kupperman, David. (1982). Scanning ultrasonic probe (U.S. Patent No. 4361044). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4361044
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile