The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 1982
Filed:
Aug. 11, 1980
Anthony W Louderback, Ojai, CA (US);
Litton Systems Inc., Beverly Hills, CA (US);
Abstract
There is disclosed a device for measuring total diffuse optical scattering from the surface of a sample, including a surface having extremely low scatter. A light beam from a laser is directed through an entrance hole in an ellipsoidal reflector and through the vicinity of a first focus of the reflector. The reflector has a first aperture adjacent the first focus for receiving a sample to be measured and a second aperture adjacent a second focus for receiving a photoresponsive means. A sample mounting means is used to position the sample at the first focus and to orient the sample so that the portion of the light beam which is specularly reflected from the sample is directed out of an exit hole located in the reflector diametrically opposite to the entrance hole. A major portion of the light diffusely scattered from the sample into a 2.pi. solid angle (hemisphere) reaches the second aperture either directly or by a single reflection from the reflector. The photoresponsive means such as a photomultiplier is positioned at the second aperture for detecting the magnitude of light scattered. In a specific embodiment, the ellipsoidal reflector is easily and cheaply made from two half-ellipsoidal mirrors which are joined together at their wide ends.