The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 1982

Filed:

Jul. 14, 1980
Applicant:
Inventors:

Charles R Martell, Dallas, TX (US);

Elmer N Leslie, Dallas, TX (US);

Don D Isett, Dallas, TX (US);

Stephen S Treadwell, Richardson, TX (US);

Assignee:

Microdynamics, Inc., Dallas, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D05B / ;
U.S. Cl.
CPC ...
11212111 ; 112275 ;
Abstract

A semiautomatic sewing system (10) comprises a sewing machine (12), a drive unit (42) including a variable speed motor and encoder for counting stitches sewn, material edge sensors (40) mounted in spaced relationship in front of the needle (22) of the sewing machine, and a microprocessor controller (51) coupled to the sewing machine controls. Accurate control of seam lengths and end points is achieved by initiating countdown of a variable preprogrammed number of final stitches responsive to material edges detected by the sensors (40) only when the stitch count falls within a predetermined window of values so that inaccuracies from stitch counting are limited to a small portion of the overall seam length. If the sensors (40) do not detect a material edge within the window of stitch values, the sewing system (10) reverts to pure stitch counting to determine seam length.


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