The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1982
Filed:
May. 29, 1980
Eberhard Nicklaus, Bergheim, DE;
Heinz Warncke, Cologne, DE;
Wilhelm Pross, Munich, DE;
Wolfgang Hartl, Munich, DE;
Bayer Aktiengesellschaft, Leverkusen, DE;
Compur-Electronic GmbH, Munich, DE;
Abstract
In an apparatus for process analysis, a test substance is removed from the process stream by a probe and fed to an analysis instrument with a measured value display. Upstream of the analysis instrument, the test gas is conveyed through condensers. A monitoring unit is coupled to the analysis instruments and the processing chain without influencing the flow of data from the analysis instrument to the measured value display. The monitoring unit receives information about the entire apparatus via status sensors which are incorporated into the processing chain and into the analysis instrument. Depending on this information, the monitoring unit can intervene via solenoid valves, switches and motor potentiometers into the apparatus and alter its operation. The condition of the apparatus can also be displayed.