The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1982

Filed:

Sep. 26, 1980
Applicant:
Inventors:

Jean D Tschirren, 2016 Cortaillod, CH;

Gilbert C Widmer, 2525 Le Landeron, CH;

Jean-Paul Pellaux, 2000 Neuchatel, CH;

Andre Coche, 67000 Strasbourg, FR;

Marcel R Samsel, 67100 Strasbourg, FR;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356 44 ; 264-15 ; 350 9630 ; 374162 ;
Abstract

The disclosed invention concerns a process for the optical measurement of temperature, a probe device for the carrying out of the process, and a process for producing probe. The probe device contains a pellet of liquid crystals which is contained within an envelope and arranged at the end of an optical fiber. The optical fiber receives light, which is continuously swept by different wavelengths and the light reflected by the liquid crystal is analyzed to detect the reflection peaks and deduce the probe temperature.


Find Patent Forward Citations

Tschirren, Jean. (1982). Process and device for the optical measurement of temperature and (U.S. Patent No. 4357106). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4357106

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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